• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
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  • 优先权
    • 专利摘要:
    Device for calibrating network analyzers. The present invention discloses a device for calibrating vector network analyzers implemented by sic and esiw technologies. The calibration device of the present invention has the particularity of being a modular device comprising connection modules (5) that are connected, on the one hand, to the vector analyzer and, on the other, to calibration modules (which can be sic modules). Or esiw). This modular configuration allows the intrinsic noises to the connection with the analyzer (including transfers to microstrip, sic, etc.) to be the same in all calibration measurements, allowing detecting and/or eliminating the noises associated with this connection. (Machine-translation by Google Translate, not legally binding)
    公开号:ES2558616A1
    申请号:ES201431464
    申请日:2014-10-03
    公开日:2016-02-05
    发明作者:Angel BELENGUER MARTÍNEZ；Elena DIAZ CABALLERO；Hector ESTEBAN GONZALEZ；Vicente Enrique BORIA ESBERT
    申请人:Universidad Politecnica de Valencia；Universidad de Castilla La Mancha；
    IPC主号:
    专利说明:

            DESCRIPTION Network analyzer calibration device OBJECT OF THE INVENTION 5 The present invention relates to a network analyzer calibration device. In particular, it refers to a network analyzer calibration device implemented by means of SIC technology (acronym for the English expression "Substrate Integrated Circuit", integrated circuit in substrate). BACKGROUND OF THE INVENTION Various network analyzers are known in the prior art. Said network analyzers are instruments for analyzing the properties of electrical networks, especially those properties associated with reflection and transmission of electrical signals, known as dispersion parameters (S-Parameters). The network analyzers operate between the ranges of 9 kHz to 110 GHz. These network analyzers require a correction of the systematic errors that occur due to the presence of wires, terminals, among others in the analyzer. For this it is necessary to perform a calibration of the device before making any measurement. The calibration of a network analyzer is a high precision process in which both the impedance in which it is operating and the conditions in which the equipment is operating must be taken into account. The calibration standard is based on four test devices called THRU 25 (connected network), LINE (empty line section) REFLECT (short circuit network) to calibrate the transmission, which must be connected to the analyzer ports so that It can compare and establish the difference between these different modes and their ideal responses. This data is stored in a record and each record must be independently calibrated and at the time a modification is made to the network under study. 30 Usually, manufacturers of such network analyzers provide kits for equipment calibration. These kits are usually essentially mechanical devices, in particular rectangular waveguides. These rectangular waveguides are high-cost devices due to the precision of their dimensions and are usually four devices, in particular, one device for each of the measurements: THRU, LINE and REFLECT.        On the other hand, in the article by E.Diaz, A. Belenguer, H. Esteban and V. Boria, “Thru-reflect-line calibration for substrate integrated waveguide with tapered microstrip transitions, published in Electronic Letters, Vol. 49 (2 ), pp 132-133 (2013) a calibration kit based on SIC technology is disclosed, in particular, using SIW technology (acronym for the English expression 5 "Substrate Integrated Waveguide", integrated waveguide in substrate). In this device a calibration kit is disclosed in which the traditional waveguide is modified by a waveguide integrated in a substrate that, despite the losses associated with the use of a dielectric contained in the substrate as a means of The passage of the waves instead of the air of the conventional waveguides, their low cost and their acceptable quality factor make it a highly advantageous device compared to other prior art devices. DESCRIPTION OF THE INVENTION The prior art devices have the disadvantage that each of the 15 calibration devices (for example, OPEN, THRU and LINE), being independent, has different electrical behaviors related, for example, to the position of its connectors, to the impedance due to the length of the paths of printed circuits, to the type of welding, to possible impurities in the welding, the way in which it was made, etc. Accordingly, the present invention discloses a device that, by means of the concept of modularity, uses common parts of the device to perform these measurements. Consequently, there are measures in which the electrical behavior is approximately equal and, although the behavior is not exactly that of the ideal conditions, at least 25 is an equal behavior for all measurements and the calibration procedure is performed with a behavior similar for all of them. Specifically, the present invention discloses a network analyzer calibration device comprising:  a first terminal intended to be connected to a network analyzer;  a first calibration element arranged in a first calibration module; and  a second calibration element arranged in a second calibration module; 35 wherein said first and second calibration elements are elements integrated in       substrate (ie, SIW) and in which the first terminal is arranged in a first connection module, said first connection module providing connection means to other modules and because the first calibration module and the second calibration module comprise means of connection conjugated to the connection means of the first connection module. 5 Preferably, the first terminal is a terminal for coaxial cable of the type known in the art as "SMA" and because the first connection module comprises means of transition from SMA to SIC (acronym for the English expression "Substrate Integrated Circuit", integrated circuit in substrate). In particular embodiments of the present invention, the transition means from 10 SMA to SIC comprise intermediate transition means for switching from SMA to microstrip and from microstrip to SIC, in particular, the transition means comprise transition means from SMA to microstrip and means of transition from microstrip to SIC. As for the calibration elements, the present invention contemplates, on the one hand that the calibration elements that require a single terminal may be, for example, OPEN and / or REFLECT elements for which the first calibration element would be an OPEN element and / or a REFLECT element respectively. On the other hand, the present invention contemplates that the calibration device of the present invention can perform measurements that require two terminals for which the device comprises a second terminal intended to be connected to the network analyzer. Preferably, said second terminal is arranged in a second connection module comprising connection means to other modules and, in addition, said second calibration element may comprise connection means conjugated to both the first and the second connection module. Similarly to the case of the first terminal, the second terminal is an SMA terminal and because the second connection module comprises means of transition from SMA to SIC that can comprise an intermediate step to microstrip, for which the means of transition from SMA to SICs comprise means of transition from SMA to microstrip and means of transition from microstrip to SIC. Some of the two terminal measurements contemplated in the present invention are, for example, THRU and / or LINE measurements for which the second calibration element may be a THRU and / or LINE element respectively. Alternatively, the device of the present       The invention may comprise two second calibration modules comprising one of said second calibration modules a THRU element and the other of said second calibration means a LINE element. In a particularly preferred embodiment, the 5-network analyzer calibration device of the present invention can be implemented in ESIW technology (abbreviated from the term "Extended Substrate Integrated Waveguide") It is an embodiment similar to SIW technology but, instead of passing the waves through the dielectric of the substrate, said waves pass through the air, which improves the quality of the signals. In this case, the device comprises: a first terminal intended to be connected to a network analyzer;  a first calibration element arranged in a first calibration module; and  a second calibration element arranged in a second calibration module; 15 in which said first and second calibration elements are empty guides integrated in the substrate and in which the first terminal is arranged in a first connection module said first connection module having means for connecting to other modules and because the first module of Calibration and the second calibration module comprise connection means conjugated to the connection means of the first connection module. Preferably, the first terminal is an SMA terminal and because the first connection module comprises transition means from SMA to ESIW. Similarly to the case of the SIW device, said transition means from SMA to ESIW may comprise transition means from SMA to microstrip and transition means from microstrip to ESIW. In the case of single-terminal calibration measurements, the device of the present invention can perform measurements, for example of OPEN and / or REFLECT for which the first calibration element is an OPEN and / or REFLECT element, said elements being implemented in ESIW technology. In the case of calibration measurements that require two terminals, the device of the present invention comprises a second terminal intended to be connected to a network analyzer, said terminal being preferably arranged in a second connection module comprising connection means to Other modules Preferably, the second calibration element 35 comprises connecting means conjugated to both the first and second       connection module Additionally, the second terminal may be, for example, an SMA terminal and the second connection module may comprise means of transition from SMA to ESIW. Said transition from SMA to ESIW may comprise means of transition from SMA to microstrip and transition means from microstrip to ESIW. As for the measurements that can be made using two terminals, the present invention contemplates that, by way of example, THRU and / or LINE measurements can be made for what the second calibration element would be a THRU and / or LINE element respectively. Finally, in a preferred embodiment, the device comprises two second calibration modules comprising one of said second calibration modules a THRU element and the other of said second calibration means a LINE element. DESCRIPTION OF THE DRAWINGS 15 To complement the description that is being made and in order to help a better understanding of the features of the invention, according to a preferred example of practical realization thereof, it is accompanied as an integral part of said description. , a set of drawings where the following is shown as illustrative and not limiting: Figure 1 shows three calibration devices of the type known in the prior art. Figure 2 shows an example of transition means of a signal received via an SMA to SIC connector. Figure 3 shows an example of connection modules according to the present invention. Figure 4 shows a mechanical exploded view of a connection module according to the present invention. Figure 5 shows three examples of calibration modules for a device according to the present invention. 35 Figure 6 shows an exploded view of the calibration device of the present invention       connected for the measurement of a THRU calibration signal. Figure 7 shows the calibration device of the present invention connected for the measurement of a THRU calibration signal. 5 Figure 8 shows the calibration device of the present invention connected for the measurement of a LINE calibration signal. Figure 9 shows the calibration device of the present invention connected for the measurement of a REFLECT calibration signal. 10 Figure 10 shows the calibration device of the present invention connected for the measurement of a DUT device (acronym for the English expression "Device Under Test", device under test). 15 Figure 11 shows an example of transition means of a signal received via an SMA to ESIW connector. Figure 12 shows the calibration device of the present invention connected for the measurement of a DUT device (acronym for the English expression "Device Under Test", 20 device under test) the calibration device being a device implemented in ESIW. PREFERRED EMBODIMENT OF THE INVENTION 25 Figure 1 shows three calibration devices of the type known in the prior art. In particular, prior art devices are three independent devices: an OPEN device (1) that is basically an open circuit; a THRU device (2), which is a device that allows the signal to pass through; and a LINE device, which is a device that allows the signal to pass through, but, unlike the THRU, the signal passage section has a significant electrical length with respect to the THRU. Regarding the realization of the state of the art, it is remarkable that each of the elements is implemented in SIC technology for which there is a dielectric path (20, 30, 40) of a substrate plate so that the signals pass through       This dielectric. One of the main problems that this type of embodiments presents with various independent devices is that, for example, the SMA connectors (10) are soldered to the substrate and said welding can present impurities, it can be located in a different place in each of the devices, etc. Therefore, these situations modify the measured signal and add an inappropriate noise that, in addition, is impossible to foresee since it is different for each of the devices. In the device of the present invention it is intended to use the same SMA connector (10) and its associated elements (such as, for example, transitions from SMA to microstrip and from microstrip to SIC) to have a similar noise signal in each of the measurements, in this way, it is easier to locate and eliminate it from the calibration measurements. Figure 2 shows an example of transition means of a signal received by an SMA connector (10) to SIC. As mentioned above, it is the main focus of noise due to the presence of multiple elements whose repeatability is practically impossible, that is, each embodiment is unique and induces different noises. In the present invention a first transition of the signal of an SMA 20 conductor to microstrip is contemplated and then the microstrip signal is converted into an SIC signal. The transition from SMA (10) to microstrip is done by welding the SMA connector (10) to a microstrip path and the transition from microstrip to SIC is done by methods known in the art, in particular, it is done by incorporating a transition (101). In addition, SIC devices have a series of holes (102) that are subjected to a metallization process. Such transitions are widely known in the art and are described in detail, for example, in the article "The substrate integrated circuits - a new concept for high-frequency electronics and optoelectronics" by Ke Wu et al. Published in Telecommunications in Modern 30 Satellite, Cable and Broadcasting Service, 2003. TELSIKS 2003. 6th International Conference on (Volume: 1, P - III-PX), ISBN: 0-7803-7963-2. Figure 3 shows an example of connection modules (5) according to the present invention. In some of the measurements contemplated in the present invention, a single connection module (5) can be had. However, other measurements require two connection modules       (5). In particular, measurements that require a single connection to the analyzer to be calibrated (such as OPEN and REFLECT) are made using a single connection module (5). In fact, the same connection module is used and only the elements corresponding to each measurement are exchanged. In this way the noise inherent in electrical connections and transmissions is the same for both devices and can be detected and discriminated from measurements more easily. Specifically, the connection module (5) of Figure 3 comprises an SMA connector (10) for connection to the analyzer, the transition elements from SMA to SIC described above and connection means to other modules. During the development of the present invention it has been determined that for there to be a connection between two SIC modules it is sufficient to make a connection between them so that the connection means 15, in particular embodiments, are mechanical means of joining any of the types known in the art. Figure 3 shows an example of the type of joining means that could be used, such as an upper plate (51) and a lower plate (52) attached to the substrate (50) by 20 screws (53) providing said plates of holes intended to receive other screws that are attached to both the substrate (50) of the connection module (5) and the calibration modules. For this, the calibration modules must have connection means conjugated to those of the connection module which, in this case, would be conjugated holes that coincide with the holes of the connection module. These connection means must make the substrate (50) of the connection module adjacent to the substrates of the other modules by making a physical connection between them that allows signals to pass from one substrate to another. 30 Referring to Figure 4, the main components of an exemplary embodiment of a connection module (5) can be seen. This embodiment of connection module (5) has a substrate (50). Said substrate comprises a transition from SMA connector (10) to microstrip (501) and a transition (502) from microstrip (501) to SIC. In addition, it has two plates: an upper plate (51) and a lower plate (52) which will be the means of connection between modules (together with the holes of the different modules). In this embodiment, it is       Especially relevant is the presence of alignment means (503) between modules which, in this case, are arranged as a square that allows the alignment of the connection modules when they come into contact with at least one side thereof. Figure 5 shows three examples of calibration modules for a device according to the present invention. In particular, Figure 5 shows a THRU module (60), a LINE module (70) and a REFLECT module (80). Each of said modules is a substrate that has a calibration element and attachment means to at least one connection module (5). As for the THRU module (60), said module is a substrate plate that has a THRU element (601) which are two series of metal pillars forming a pair of parallel lines that cross the entire length of the module. As for the means for joining other modules, this module has first holes (602) conjugated with corresponding holes in a connection module (5) and some second holes (603) conjugated with corresponding holes in another connection module ( 5). As for the LINE module (70), said module is a substrate plate that has a LINE element (701) which are two series of metal pillars forming a pair of parallel lines that span the entire length of the module. As for the means for joining other modules, this module has first holes (702) conjugated with corresponding holes 20 in a connection module (5) and some second holes (703) conjugated with corresponding holes in another connection module (5). Unlike the THRU element (601), the LINE element (701) is longer than the THRU, which allows the signal to undergo a significant and necessary additional lag for calibration. Finally, the REFLECT module (80) is also a substrate plate that has a REFLECT element (801) consisting, in this embodiment, of two series of metallic holes that form a pair of parallel lines that only partially cross the length 30 of the module and which are connected, at its end that does not reach the end of the module, by a series of metal pillars perpendicular to both parallel lines. Since this calibration module uses only one analyzer output, the REFLECT module (80) has, unlike the calibration modules described above, holes (802) conjugated with holes corresponding to a single connection module (5). 35       Figure 6 shows an exploded view of the calibration device of the present invention connected for the measurement of a THRU calibration signal by connecting the THRU module (60) to two connection modules (5), one for each of the connections of the analyzer. 5 In this figure, the connection cables (4) to the analyzer that are connected to the calibration device are observed, in particular, by means of the SMA connector (10). In addition to the parts of each of the modules that have been described previously, this figure allows us to observe the way of connecting the THRU module (60) to the connection modules (5) said connection is made by arranging the modules adjacently, When the elements of 10 come into contact with the different modules, a connection between them is generated. Therefore, it is important that the holes arranged in the plates (51, 52) and the conjugated holes (602, 603) of the THRU module (60) are configured so that this contact exists. In addition, it is especially important that there are alignment means (503) that ensure that the modules are correctly aligned. 15 Figures 7, 8 and 9 show the calibration device of the present invention connected for the measurement of the different THRU, LINE and REFLECT calibration signals by connecting the THRU module (60), the LINE module (70) and the REFLECT module (80) to the analyzer inputs or outputs as appropriate. 20 Figure 10 shows the calibration device of the present invention connected for the measurement of a DUT device. This DUT device corresponds to a device module (90) which, in the example of figure 10, has a band-pass filter (901). Similarly to the case of calibration modules, this element has conjugate means 25 for connecting to two connection modules (5) that will be connected to inputs or outputs of the analyzer via cables (4). Figure 11 shows an example of transition means of a signal received by means of an SMA connector (10) to ESIW. This figure is especially relevant since, just as the signal 30 of the SMA connector (10) can be converted to an SIC signal by means known in the art (explained above referring to Figure 2), by known means, it can be converted the signal from an SMA connector (10) to an ESIW signal. In particular, if you work with ESIW devices instead of SIC you have the advantage that, while in SIC devices the signals pass along the modules through a       dielectric (content in the substrate), in the case of ESIW the signals pass through the air, which significantly reduces the losses of the signal. In particular, Figure 11 shows the implementation of ESIW on a substrate (111), which also has a peak (112) for the transition of the signal into the air. 5 Figure 12 shows the calibration device of the present invention connected for the measurement of a DUT device (acronym for the English expression "Device Under Test", device under test) the calibration device being a device implemented in ESIW. In this case, the DUT used is a band pass filter that is generated using a series of metal pillars (116) and a hole (114) in the substrate (111) through which the 10 signal to be measured will pass. Therefore, the present invention contemplates transferring the modularity concept explained for SIC technology by referring to Figures 1 to 10 to the ESIW technology of Figures 11 and 12. This would be done by creating a connection module with means for joining modules of calibration and arranging the calibration modules of joining means conjugated to those of the connecting means. 20 25 
    权利要求:
    Claims (18)
    [1]
    CLAIMS 1. Network analyzer calibration device comprising:  a first terminal designed to connect to a network analyzer;  a first calibration element arranged in a first calibration module; and  a second calibration element arranged in a second calibration module; characterized in that the first terminal is arranged in a first connection module (5), said first connection module having means of connection to other modules and 10 because the first calibration module and the second calibration module comprise connection means conjugated to the connection means of the first connection module (5).
    [2]
    2. Network analyzer calibration device, according to claim 1, characterized in that said first and second calibration elements are elements integrated into the substrate.
    [3]
    3. Network analyzer calibration device, according to claim 1, characterized in that said first and second calibration elements are empty guides integrated into the substrate. twenty
    [4]
    4. Network analyzer calibration device, according to claim 2, characterized in that the first terminal is an SMA terminal (10) and in that the first connection module comprises transition means from SMA to SIC.
    [5]
    5. Network analyzer calibration device, according to claim 2, characterized in that the transition means from SMA to SIC comprise transition means from SMA to microstrip (501) and transition means (502) from microstrip to SIC.
    [6]
    6. Network analyzer calibration device, according to claim 3, characterized in that the first terminal is an SMA terminal (10) and in that the first connection module comprises transition means from SMA to ESIW.
    [7]
    7. Calibration device for network analyzers, according to claim 6, characterized in that the transition means from SMA to ESIW comprise means ofSMA to microstrip transition (501) and microstrip to ESIW transition media.
    [8]
    8. Network analyzer calibration device, according to claims 2 or 3, characterized in that the first calibration element is a REFLECT element (801). 5
    [9]
    9. Network analyzer calibration device, according to claims 2 or 3, characterized in that it comprises a second terminal designed to connect to the network analyzer.
    [10]
    10. Network analyzer calibration device, according to claim 9, characterized in that said second terminal is arranged in a second connection module (5) that comprises means of connection to other modules.
    [11]
    11. Calibration device for network analyzers, according to claim 10, characterized in that the second calibration element comprises connection means 15 conjugated to both the first and the second connection module.
    [12]
    12. Network analyzer calibration device, according to claim 10, characterized in that the second terminal is an SMA terminal (10) and that the second connection module comprises transition means from SMA to SIC. twenty
    [13]
    13. Calibration device for network analyzers, according to claim 12, characterized in that the transition means from SMA to SIC comprise transition means from SMA to microstrip (501) and transition means (502) from microstrip to SIC. 25
    [14]
    14. Network analyzer calibration device according to claim 10, characterized in that the second terminal is an SMA terminal and that the second connection module comprises transition means from SMA to ESIW.
    [15]
    15. Calibration device for network analyzers, according to claim 14, characterized in that the transition means from SMA to ESIW comprise transition means from SMA to microstrip and transition means from microstrip to ESIW.
    [16]
    16. Calibration device for network analyzers, according to claim 11,characterized in that the second calibration element is a THRU element (601).
    [17]
    17. Calibration device for network analyzers, according to claim 11, characterized in that the second calibration element is a LINE element (701). 5
    [18]
    18. Network calibration device, according to claim 11, characterized in that it comprises two second calibration modules, one of said second calibration modules comprising a THRU element (601) and the other of said second calibration means a LINE element (701) .
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    同族专利:
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    ES2558616B1|2016-12-28|
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    WO2016051008A1|2016-04-07|
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    引用文献:
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    优先权:
    申请号 | 申请日 | 专利标题
    ES201431464A|ES2558616B1|2014-10-03|2014-10-03|NETWORK ANALYZERS CALIBRATION DEVICE|ES201431464A| ES2558616B1|2014-10-03|2014-10-03|NETWORK ANALYZERS CALIBRATION DEVICE|
    US15/516,587| US20180267129A1|2014-10-03|2015-10-02|Device for Calibrating Network Analysers|
    PCT/ES2015/070721| WO2016051008A1|2014-10-03|2015-10-02|Device for calibrating network analysers|
    EP15846404.0A| EP3203257A4|2014-10-03|2015-10-02|Device for calibrating network analysers|
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